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Маркировка	Производитель	Описание
SN74BCT760NE4	Texas Instruments	IC BUFF/DVR OCTAL N-INV 20DIP	Заказать
SN74BCT760NSRE4	Texas Instruments	IC BUFF/DVR OCTAL N-INV 20SOP	Заказать
SN74BCT8240ADW	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-SOIC	Заказать
SN74BCT8240ADWR	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-SOIC	Заказать
SN74BCT8240ADWRE4	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-SOIC	Заказать
SN74BCT8240ANT	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-DIP	Заказать
SN74BCT8244ADW	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-SOIC	Заказать
SN74BCT8244ADWR	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-SOIC	Заказать
SN74BCT8244ANT	Texas Instruments	IC SCAN TEST DEVICE BUFF 24-DIP	Заказать
SN74BCT8245ADW	Texas Instruments	IC SCAN TEST DEVICE TXRX 24-SOIC	Заказать
SN74BCT8245ADWR	Texas Instruments	IC SCAN TEST DEVICE TXRX 24-SOIC	Заказать
SN74BCT8245ANT	Texas Instruments	IC SCAN TEST DEVICE TXRX 24-DIP	Заказать
SN74BCT8245ANTE4	Texas Instruments	IC SCAN TEST DEVICE TXRX 24-DIP	Заказать
SN74BCT8373ADWR	Texas Instruments	IC SCAN TEST DEVICE LATCH 24SOIC	Заказать
SN74BCT8373ADWRE4	Texas Instruments	IC SCAN TEST DEVICE LATCH 24SOIC	Заказать
SN74BCT8373ANT	Texas Instruments	IC SCAN TEST DEVICE LATCH 24-DIP	Заказать
SN74BCT8373ANTE4	Texas Instruments	IC SCAN TEST DEVICE LATCH 24-DIP	Заказать
SN74BCT8374ADW	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	Заказать
SN74BCT8374ADWR	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	Заказать
SN74BCT8374ADWRE4	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	Заказать

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